PaALAaUELCLD
TABLE 4
D FOR WEIC
E
z
FACTORS US
HS
D
SIMULTANEOUS ADJUSTMENT CF PHOTOGRAI
11
E. TEST RESULTS
Tests using specified control arrays are labeled as follows:
Control Point Test Case Plate Coordinate
Array Label + Perturbations
A 1A
1B Random Normal Deviates, only
(0 = 6 micrometers)
C 1C
A 2A Random Normal Deviates
à 22 (0 = 6 micrometers)
plus residual systematic
C oC deviations.
ve
1. Results with Specified Tests
Test results obtained by participants using sequential and simultaneous
procedures with plate coordinates perturbed by random normal deviates only
(Test Cases 1A, 1B, 1C) are tabulated in Tables 1A, 1B, and 1C. These tables
display: (a) root mean square errors (RMSE)* of discrepancies in check points
for X and Y coordinates (my, my), position (my y)» and elevation (my); (b) degree
of equation used in block adjustment by TRA methods; (c) number of
iterations required for convergence; and (d) number of points in the sample
of check values. Table 1A' lists results obtained by Participant 1 with
control array A' illustrated in Figure 4.
Tests results with plate coordinates perturbed by random plus residual
systematic deviations (Test Cases 2A, 2B, 2C) are listed in Tables 2A, 25
and 2C, respectively.. Results obtained by Participant 1 for Test Case 2A
are given in Table 24'.
The tables cited above enable comparison of one procedure versus another
for the same test array. To facilitate comparison of the effects of adding
ground control and of introducing systematic perturbations in plate coordinates,
the RMSE's for discrepancies in elevation, mz, and position, myy, in check
points are listed for each participant for all test cases in Table 5. The
RMSE's of discrepancies in position and elevation for expauure station co-
ordinates are tabulated in Table 6 for all test cases.
Additional items of interest output from direct simultaneous procedures
are the estimated standard deviations of unit weight, mg, in plate coordinate
residuals for the respective adjustments, listed in Table 7. Using the
standard deviation of 6 micrometers for the applied perturbations, variance
E
* RMSE (root mean square error) - 1 where NET. calculated value - true
value and i = 1, 2, ..., n the MEER of cech points.