Ene
N p N EE SR SEL 3 Ge SAN WOT SS WT OT A AG NEUE HT
X J] CRIT OAK A NC NR NG Fine Arf fe
mh sd:
M(R) MR) .
€ -345
1,01 £=9 n £m. si
À - 530nm Scanning
0,84 N 081\ direction
: cT MTF of diffraction ole 1 4
0,61 aghast MTF ! |^
044 Li
021 ~N
dr LE L t IT
R'inmm ——-e
1,01 1 0- |
I ) e
À = 650 nm
T
Ne
200 300
A= 720nm
.
ON
.* N
«N
° a =
—- + + e — +
(0 —. 200 300
Fig.2: MTF-Curves of Pinatar 4/125
Measuring plane see text