Full text: Photogrammetric and remote sensing systems for data processing and analysis

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Fig. 1: Components of the DSS at the Technical University of Berlin 
So far considerable hardware limitations have reduced the applicability of the 
system. The main purpose of recent studies is to gain experience in handling imagery 
of limited size (512x512 pixels), keeping the processing time as short as possible. Up 
to now processing of larger amounts of image data, e.g. digitized aerial photo- 
graphy, has been possible but not efficient. 
The data for the studies at the Technical University of Berlin are acquired by an 
A/D conversion of Scanning Electron Microscope (SEM) signals. It must be stressed 
that there is no fundamental difference in processing between SEM data and other 
types of stereo imagery. Possibly, a slightly changed mathematical model is valid 
and SEM object texture and topography are more difficult to handle. The assumption 
seems to be justified that experience made by evaluating SEM imagery may be 
useful for the processing of other data, as, for instance, aerial photography. 
Furthermore, the evaluation of SEM data shows the versatility of the DSS. 
TEST OBJECTS 
SEM images from surfaces of broken metallic workpieces are used for first practical 
tests of the DSS. These images result from a research project which is sponsored by 
the German Research Foundation (Deutsche Forschungsgemeinschaft). In the course 
of growing demands for three-dimensional (3D) information from electron micro- 
graphs it was established in cooperation with the working group 'Metallography and 
Metallic Constructions' at the Federal Board of Material Testing (Bundesanstalt fiir 
Materialpriifung - BAM) in Berlin. 
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