IAPRS & SIS, Vol.34, Part 7, "Resource and Environmental Monitoring", Hyderabad, India, 2002
Figure 1. Methodology for runoff estimation
The information extracted from the remote sensing data is in
the form of Digital Numbers, which needs to be transformed in
the real parametric values by using models. Furthermore the
radiance values of the different land cover features have to be
further corrected which may not be real because of the
atmospheric effects. The estimation of parametric values using
active and microwave remote sensing is dependent on the
dielectric constant, the roughness of the surface (Van Oevelan,
2000) and state of the atmosphere. In most images from active
radar systems for e.g. the most obvious features are those
associated with the topography and the roughness of the
surface, such as different vegetation covers. Many radar
backscattering inversion techniques have been practised for
estimation of surface soil moisture (Van Oevelen and
Hoekman, 1999) (Fig.2). Geographical Information system is
increasingly being used to store catchment data and interact
with distributed hydrological models in setting up model and
runs the displaying the results. The information stored in GIS
(e.g. soil type, vegetation type) may also require an
interpretative model before being useful in hydrological
modeling (Beven, K.J., 2002).
4. EXPECTED RESULTS
The present study will help to evaluate the following outputs:
I. Estimating effective parameteric values of soil
moisture using microwave data
2. Hydrological behaviour of the watershed.
3. Factors leading to érosion
4. Runoff estimation
Badscatter
Coefficient
oe.
DEM or DTM
Iiirgriiiprirprrret
ei
i
i
Database/GIS
Other RS data |
Ini
-NDVI
-Pol. Scatter. Class
-Ground tutVGIS
-Clo
ILAMEN UE EC ENS
ud model ||
-Rad. transfer |
-Autocorrelaticn length i
-RMS hight difference |}
Dielectic
properties
Tm
-Semi-empirical approaches |i
Wang and Schmugge (1980) |
Dobson et al., (1095)
Hallikainen et al.. (19855
Figure 2. Steps in the inversion of soil moisture from
microwave backscatter measurements (Van Oevelan, 2000)
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