International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, Volume XXXIX-B4, 2012
XXII ISPRS Congress, 25 August — 01 September 2012, Melbourne, Australia
Calculated Location Standard Delta True,
Deviation, m m
Object Lat Lon Lat | Lon | Lat | Lon
AlIILM| 0.67431 23.47318 | 128 | 15.6 | 48 | 14
AI2 LM | -3.01269 | 336.57805 | 11.8 | 17.0
AI4 LM | -3.64595 | 342.52822 | 11.5 | 14.4 | -1.4 | 5.1
A15 LM | 26.13236 3.63335 13.0 | 16.3 | -0.4 | 1.5
Al6 LM | -8.97341 15.50106 | 12.6 | 93
AI/LM_ 20.19113 | 30.77221 | 15.3 | 14.0
All PSE| 0.67333 2347313 | 118 | 161 | 36! 12
A12
ALSEP -3.00960 | 336.57514 | 9.9 | 11.5
A -3.64426 | 342.52248 | 12.4 | 14.2 | -1.9 | 4.9
ALSEP . : ; . ; :
Als 26.13407 3.63006 12.9 | 17.9 | 0.3 | 4.8
ALSEP . x 4 i ; :
AI6
ALSEP -8.97589 | 15.49850 | 12.4 | 11.2
AI 20.19234 | 30.76521 | 15.4 | 18.4
ALSEP s : 2
Table 3. Location of Apollo surface hardware derived from
NAC images using the improved pointing correction
4.2 WAC Calibration Results
Using the data from the in-flight WAC calibration outlined in
Section 3.2.1, a new pointing and distortion model was
empirically derived. This new model removes the twist
previously seen in the image data (Figure 9) and eliminates
residual errors still present after the pre-flight calibration. The
resulting model projects each pixel of the frame with sub-pixel
accuracy (Figure 10).
4
aslo
3
Count
0 om
-300 -200 -100 0 100 200 300
Residual Error, m
-300 -200 -100 0 100 200 300
Residual Error, m
Figure 10. Residual errors in the down track (top) and cross
track (bottom) direction before (blue) and after (red) applying
the updated camera pointing and improved distortion model.
4.3 Release of In-Flight Calibration Results
The product of the calibration efforts highlighted here will be
included in a set of updated SPICE kernels delivered to
Navigation and Ancillary Information Facility (NAIF) and the
USGS [Acton, 1996]. There will be updates to the pointing
information found in the Frames Kernel (FK), new temperature
dependent C-matrix Kernels (CK) for NAC pointing correction,
and a new camera model and distortion model defined in the
LROC Instrument Kernel (IK). These products will be released
during the summer of 2012.
5. REFERENCES
Acton, C.H., 1996. Ancillary Data Services of NASA's
Navigation and Ancillary Information Facility, Planetary and
Space Science, 44(1), pp. 65-70.
Anderson, J.A., Sides, S.C., Soltesz, D.L., Sucharski, T.L,
and Becker, K.J., 2004. Modernization of the Integrated
Software for Imagers and Spectrometers. Lunar and
Planetary Science Conference XXXV, #2039.
Brown, D.C. 1966. Decentering Distortion of Lenses,
Photogrammetric Engineering, 32 (3), pp. 444-462.
Brown, D.C. 1971. Close-Range Camera Calibration.
Photogrammetric Engineering, 37(8), pp. 855-866.
Lee, E.M. et al., 2012. Controlled Polar Mosaics of the Moon
for LMMP by USGS. Lunar and Planetary Science
Conference XLIII, #2507.
Mazarico, E., Rowlands, D.D., Neumann, G.A., Smith, D.E.,
Torrence, M.H., Lemoine, F.G., Zuber, M.T., 2012. Orbit
Determination of the Lunar Reconnaissance Orbiter, Journal of
Geodesy, 86(3), 193-207.
Murphy, T.W., et al, 2010. Laser Ranging to the Lost
Lunokhod~1 Reflector, Icarus, 211(2), pp. 1103-1108.
Robinson, M.S. et al, 2010. Lunar Reconnaissance Orbiter
Camera (LROC) Instrument Overview, Space Science Reviews,
150(1-4), pp. 81-124.
Scholten, F., et al., 2012, GLD100: The Near-Global Lunar 100
m Raster DTM from LROC WAC Stereo Image Data, Journal
of Geophysical Research, in press.
Speyerer, E.J., Robinson, M.S., 2012. Persistently Illuminated
Regions at the Lunar Poles: Ideal Sites for Future Exploration,
Icarus, in revision.
Vondrak, R., Keller, J., Chin, G., Garvin, J., 2010. Lunar
Reconnaissance Orbiter (LRO): Observations for Lunar
Exploration and Science, Space Science Reviews, 150(1-4), pp.
7-22.
6. ACKNOWLEDGEMENTS
The LROC Team would like to acknowledge the scientist and
engincers at Malin Space Science Systems who designed, built,
and integrated the LROC system. We would not be able to
produce products with such a high level of precision and
accuracy without their attention to detail and craftsmanship.
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