1978 ISP COMMISSION V INTER-CONGRESS SYMPOSIUM — STOCKHOLM SWEDEN 
——  — U. 8 a HÀ ^ o Am Ho o o n Ho o o m o t m — —— — te ah m iu o m o m —— 
— 0 o o Lo A o m o m o m o Sean Se Ho o dn me ee th amm o o t We — 
Linkwitz: line have been introduced. You remember the example of the 
space shuttle. I can easily image the same sort of thing being installed 
on assembly lines in industry as a feedback system. In any case this 
arouses my fantasy for future industrial applications. And that it is 
already possible I think is quite remarkable to hear here. Then I found 
also very remarkable in this context, the new level of accuracies which can 
be achieved with non-conventional photogrammetry. I am thinking of holo- 
graphy, where in the specimen we can measure with an accuracy of microns. 
Then, regarding the evaluation of results, data processing, and the way of 
presenting results, I think the analytical plotter is something which may 
be of really great importance due to its large capability within industrial 
applications, because it goes in the direction of a system, and certainly 
if we want to promote photogrammetry in industry, we think of a whole system, 
as in the example of Rolls Royce. And in the manner of presentation of re- 
sults, I also found it very remarkable that the fringes can be made directly 
visible on the object, which gives the possibility of direct interpretation, 
with a very high accuracy. You remember very well the vivid presentation we 
had here by Nils Abramson. These are, as I said, by no means complete, but 
some spotlights on developments which I think may be remarkable in this field. 
To close, again those of you colleagues who have not yet joined the Working 
Group, we will write to all of you who have been present, and whose names we 
now know. Please feel free to write to us, because we know that quite an 
effort will be necessary to promote photogrammetry in the direction we are 
now contemplating. Thank you very much. : 
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Karara: I will make a few points concerning Tuesday morning's session on 
Analytics, and also concerning the symposium in general, looking at it from 
the point of view of Working Group V-1. First of all there were no sur- 
prises. There were no spectacular developments reported to or resulting 
from this symposium. Secondly, the papers presented at the session on Analy- 
tics reflected the steady and systematic progress on most fronts of the pro- 
gram of Working Group V-1. Thirdly, the importance of incorporating sto- 
chastic treatment of reliability problems in close range photogrammetric 
solutions was made very clear. A statistically-founded strategy for gross 
error detection was shown to provide remarkable efficiency.  Fourthly mathe- 
matical formulations and statistical analysis for ultra precise camera cali- 
bration were discussed. Fifthly, yet another data reduction solution, par- 
ticularly suitable for non-metric imageries, has been developed. Thus the 
user now has the luxury of being able to choose from three possibile solutions, 
the DLT, the University of New Brunswick's Self-Calibration Method, or the 
Eleven-Parameter Solution of the University of Stuttgart. Sixthly, good 
progress has also been reported on on-line and real-time systems. Seventhly, 
in an effort to provide a better understanding of the photogrammetric poten- 
tials of non-metric cameras and their important role in data acquisition 
activities, the Working Group has added, yesterday, a top priority effort to 
its program which I outlined at the beginning of this symposium on Monday. 
A tutorial-type invited paper on data acquisition systems in general, ex- 
plaining the reasins and logic behind why non-metric cameras are coming into 
use, has been decided upon for the Hamburg Congress. It is hoped that the 
widest dissemination of such information would assist engineers and scien- 
tists, and others in various disciplines, in making full use of the economi- 
cal and technical advantages of photogrammetry.