Full text: XVIIth ISPRS Congress (Part B5)

    
  
   
  
  
   
  
   
   
  
  
  
  
  
  
    
   
   
   
   
  
   
  
  
   
  
   
   
  
    
    
  
   
   
  
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FORNO, C. and KEARNEY, A. (1987). The Effects of 
Humidity on The Profile of Photographic Plates, Division 
of Mechanical and Optical Metrology, National Physical 
Laboratory, Teddington. 13pp. 
FRASER, C.S. (1982). Film Unflatness Effects in 
Analytical Non-Metric Photogrammetry, International 
Archives of Photogrammetry and Remote Sensing 
24(V/1): 156. 
FRASER, C.S. (1984). Multiple Exposures in Non-Metric 
Camera Applications, International Archives of 
Photogrammetry and Remote Sensing 25(5): 232-239. 
FRYER, J. (1988). Lens Distortion and Film Flattening: 
their Effect on Small Format Photogrammetry, 
International Archives of Photogrammetry and Remote 
Sensing 27(5): 194-202. 
KODAK (1987). Kodak Technical Pan Films, Kodak Ltd 
Publication P-255. 7-87-BX. 12pp. 
MURAI, S, MATSUOKA, R. and OKUDA, T. (1984). A 
Study on Analytical Calibration for Non Metric Cameras 
and the Accuracy of 3D Measurement. International 
Archives of Photogrammetry and Remote Sensing 25(5): 
570-579. 
OLDFIELD, S. (1986). Photogrammetric Plate 
Measuring Facilities at NPL, International Archives of 
Photogrammetry and Remote Sensing 26(5): 541-545. 
ROBSON, S. (1990) The Physical Effects of Film 
Deformation in Small Format Camera Calibration. 
International Archives of Photogrammetry and Remote 
Sensing 28(5/1): 236-243. 
ROBSON, S. (19912). Is there a. Future for Film in Close 
Range Photogrammetry?. Photogrammetric Record 
13(77) 703-716. 
ROBSON, S. (1991b). Some Influences of the 
Photographic Process on the Accuracy of Close Range 
Photogrammetry with a Non-Metric Camera, PhD Thesis, 
City University , London, 350 pages 
TORLEGARD, J. (1989). Theory of Image Coordinate 
Errors. Chapter 7 from the Handbook of Non- 
Topographic Photogrammetry (ed KARARA). 2nd 
Edition, American Society of Photogrammetry and 
Remote Sensing, Falls Church USA. 445pp. 
WESTER EBBINGHAUS, W. (1988). Analytics in 
Non-Topographic Photogrammetry, International 
Archives of Photogrammetry and Remote Sensing 27(5): 
380-392. 
ZEISS (1985). ZKM 02-150D and ZKM 1-150D. Two 
Coordinate Measuring Microscopes. VEB Carl Zeiss 
(Jena). D.D.R. Ag. 98/091/75. 17pp. 
ZIEMANN, H. (1980) High Accuracy Photogrammetric 
Determination using Image Deformation Correction, The 
Canadian Surveyor 38(1): 65-74.
	        
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