10 ve
ch is
low
Xtra
nage
2s of
and
have
o be
1e of
at Is
vork
ly in
n an
1g in
how
etric
1atic
ence
ging
hich
and
etric
oper
s À.
nical
ical
the
'aert,
rtsel,
s for
FORNO, C. and KEARNEY, A. (1987). The Effects of
Humidity on The Profile of Photographic Plates, Division
of Mechanical and Optical Metrology, National Physical
Laboratory, Teddington. 13pp.
FRASER, C.S. (1982). Film Unflatness Effects in
Analytical Non-Metric Photogrammetry, International
Archives of Photogrammetry and Remote Sensing
24(V/1): 156.
FRASER, C.S. (1984). Multiple Exposures in Non-Metric
Camera Applications, International Archives of
Photogrammetry and Remote Sensing 25(5): 232-239.
FRYER, J. (1988). Lens Distortion and Film Flattening:
their Effect on Small Format Photogrammetry,
International Archives of Photogrammetry and Remote
Sensing 27(5): 194-202.
KODAK (1987). Kodak Technical Pan Films, Kodak Ltd
Publication P-255. 7-87-BX. 12pp.
MURAI, S, MATSUOKA, R. and OKUDA, T. (1984). A
Study on Analytical Calibration for Non Metric Cameras
and the Accuracy of 3D Measurement. International
Archives of Photogrammetry and Remote Sensing 25(5):
570-579.
OLDFIELD, S. (1986). Photogrammetric Plate
Measuring Facilities at NPL, International Archives of
Photogrammetry and Remote Sensing 26(5): 541-545.
ROBSON, S. (1990) The Physical Effects of Film
Deformation in Small Format Camera Calibration.
International Archives of Photogrammetry and Remote
Sensing 28(5/1): 236-243.
ROBSON, S. (19912). Is there a. Future for Film in Close
Range Photogrammetry?. Photogrammetric Record
13(77) 703-716.
ROBSON, S. (1991b). Some Influences of the
Photographic Process on the Accuracy of Close Range
Photogrammetry with a Non-Metric Camera, PhD Thesis,
City University , London, 350 pages
TORLEGARD, J. (1989). Theory of Image Coordinate
Errors. Chapter 7 from the Handbook of Non-
Topographic Photogrammetry (ed KARARA). 2nd
Edition, American Society of Photogrammetry and
Remote Sensing, Falls Church USA. 445pp.
WESTER EBBINGHAUS, W. (1988). Analytics in
Non-Topographic Photogrammetry, International
Archives of Photogrammetry and Remote Sensing 27(5):
380-392.
ZEISS (1985). ZKM 02-150D and ZKM 1-150D. Two
Coordinate Measuring Microscopes. VEB Carl Zeiss
(Jena). D.D.R. Ag. 98/091/75. 17pp.
ZIEMANN, H. (1980) High Accuracy Photogrammetric
Determination using Image Deformation Correction, The
Canadian Surveyor 38(1): 65-74.