5201 
"_- = ; m grain 2: <1-11>- tensile axis 
=e z A gain 3: <2-11>- tensile axis 
ke elector % 15 & gan 4; <3-22>- tensile axis 
Splacemente ' e grain 5: <1 00>- tensile cxis 
dal stresses 9 
related to "10 A 
15s, Stresses 
ler are found in 
il = 
"On radiation 
Search project, a a 
ba ; 
’ 30,0 40, 
op load stress ¢' [MPa] 
5 ! 
Figure 1: Linear Dependency of Load Stress oc! and Electromagnetically Determined Residual 
; magnetic Stress o' gy in Individual Grains 
n or smaller, 
pulation The residual stress values recorded by the Barkhausen Noise Eddy Current Microscope can be 
nation displayed as line- or area scans. 
hausen Noise 
ng. Inthe 
= in 
© 30 = =a 
2 ] — 
th | x“ 
, 20 ir. 
dual micro- 5 | aa YY NLA 
system, © T ] a 
le testing -- ha Wi 
tion using a ] a 
nagnetic 0 © | 2,1 
jographically x [mm] 
s are displayed | 
s 12 caused Ce 
rements 2 7 
aid 0 SE —— 
lv expected. | X 
Figure 2:External Load o' and Residual Stress of the Second Order oc", established by BEMI and 
XPA Inside Individual Grains of Different Crystal Orientation. XPA only delivers a mean 
value per grain. The Residual Stress Distribution "gum is represented by Line-Scans 
through the Center of Grains 1-5 of the Nickel Specimen. The Standard Mean Deviation of 
ol. and o'lyps is 2.7MPa. 
10,0 20,0 ; 
101