Full text: Fortschritte in der Metallographie

necessary to obtain a given accuracy is significantly smaller for method 3 than for method 2. For Untersdh 
1 mm? the experimental error of method 2 corresponds to that of method 1. Probeno 
Flavio 5 
Conclusions en 
For regularly structured surfaces, 3D roughness parameters obtained from profilometry can "Max! 
conveniently be used to assess local plastic deformation with a resolution corresponding to that of 
the usual measuring grid technique (1x1 mm?). Automatic measurement is possible but the accuracy 
is limited to about +/-0.05 true strain which may prove insufficient for practical purposes. Kurzfas 
Surface patterns like lubricant pockets or microstructural features visible in etched surfaces can Die Kırate 
advantageously be used instead of grids. The grain structures of the ferritic steel investigated here [ie 
offers excellent opportunities for assessment of strain with a high resolution. The experimental error u. 
is related to the resolution by the usual rules of statistics. If a comparison of same location before IS de 
and after deformation is possible, a high lateral resolution and a high precision, independent of each oh 
other, are obtained. The limit of resolution depends only on the size of the smallest features which Die ing 
can be relocated in the magnified images after deformation and the experimental error is Lisi 
appreciably smaller than for all other methods tested in this work. in wi 
Auflösung 
Acknowledgements PE 
The authors are grateful to Prof. H. E. Exner for helpful discussions on the subject matter and Zur Char 
suggestions for improving the manuscript. The project was supported within the fri 
“Sonderforschungsbereich 298, Teilprojekt A10” of the “Deutsche Forschungsgemeinschaft”. Die beste 
zu durchs 
References wr 
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Eisen 117 (1997) 7, 89-94 Warn . 
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(5) J. Staeves: "Beurteilung der Topografie von Blechen im Hinblick auf die Reibung bei der oo 
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(6)  H.E. Exner: “Quantitative Description of Microstructural Geometry — A Practical Guide to es 
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