Full text: Fortschritte in der Metallographie

Prakt. Met. Sonderband 38 (2006) 85 
(a) Optical micrograph, TZM (b) TZM SEM (BSE) 
at grain 
sontrast) 
ZM 
ail. The oo oT Co en 
7M and (¢) Optical micrograph, Mo-T1 (d) Mo-Ti SEM (BSE) 
EM the 
n linear Fig. 4: Optical and SEM micrographs of as worked alloys TZM and Mo-Ti, microsections 
gthened nernendicular to rollina direction 
as TZM 
cept of 
les. The 
jarticles 
ratio of 
electron 
provide 
entation 
degree, 
> lowest 
it a high 
of TZM 
s Mo-Ti 
subgrain 
w angle Ti 
sible for . „EEE mm 
re high a) SEM backscattered electron contrast b) EBSD-orientation map 
Fig. 5: SEM microstructure investigation of TZM hot rolled at 1400°C
	        
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