Full text: Fortschritte in der Metallographie

8 Prakt. Met. Sonderband 38 (2006) 
Holzapfel, C., Jeanvoine, N., Soldera, F., Faundez, A., & Micklich, F. (2005) 3D- Solde 
Investigation of Plasma Erosion Craters using a Dual Beam Workstation, Microscopy lokale 
Conference Davos 2005, Proceedings 
Uchic 
Holzapfel, C., Soldera, F., & Micklich, F. (2006a) in preparation for Journal of chara 
Microscopy SEM. 
Holzapfel, C., Schaf, W, Marx, M., & Micklich, F. (2006b) in preparation Velict 
2006) 
Holzer, L., Indutnyi, F., Gasser, PH., Minch B. & Wegmann, M. (2004), Journal of 
Microscopy, 216, 84-95. Velick 
Grapt 
B.J. Inkson, M. Mulvihill and G. Mébus, Scripta Mater, 45, 7, 753-758 (2001a). 3D Prakti 
determination of grain shape in a FeAl-based nanocomposite by 3D FIB tomography 
Wu, | 
B.J. Inkson, T. Steer, G. M6bus and T. Wagner, J. of Microsc., 201, 2, 256-269 analy: 
(2001b) Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D nanoc 
by FIB microscopy 
Jeanvoine, N., Holzapfel, C., Soldera, F. & Mucklich, F. (2006), Prakt. Metallogr., 
43(3), 107-119 
Konrad, J., Zaefferer, S., Raabe, D. (2006) Investigation of orientation gradients 
around a hard Laves particle in a warm-rolled Fe3Al-based alloy using a 3D EBSD- 
FIB technique. Acta Materialia, 54(5): 1369-1380, 2006 
Kotula, P. G., Keenan, M. R., & Michael, J. R. (2006) Tomographic Spectral Imaging 
with Multivariate Statistical Analysis: Comprehensive 3D Microanalysis, Microsc. 
Microanal. 12, 36-48 
Lasagni, F., Lasagni, A., Holzapfel, C., Micklich, F., Degischer, H. P. (2006a), Three 
Dimensional Characterization of unmodified and Sr-modified Al-Si eutectics by FIB 
and FIB EDX Tomography, Adv. Eng. Mater. (im Druck) 
Lasagni, F., Lasagni, A., Holzapfel, C., Micklich, F., H.P. Degischer, H.P. (2006b), 
Three-dimensional study of Si-eutectic structures in unreinforced and short fibre 
reinforced Al-alloys, Sonderbande der Praktischen Metallographie (diese Ausgabe) 
Marx, M., Schaf, W., Vehoff, H., Holzapfel, C. (2006) Initiation of microcracks by 
focused ion beam: a method for a systematical investigation of the interaction of 
cracks with microstructural barriers, Materials Science and Engineering A. accepted 
Mucklich, F., Jeanvoine, N., Holzapfel, C., & Soldera, F. (2006) FIB-Tomography and 
3D Reconstruction of Crater Formation due to Discharge Phenomena. Proceedings 
of the 23rd International Conference on Electrical Contacts, ICEC 2006, Sendai, 
Japan, pp. 405-410 
Ohser, J., Mucklich, F.: “Statistical Analysis of Microstructures in Materials Science”, 
John Wiley & Sons, 2000
	        
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