Prakt. Met. Sonderband 46 (2014) 167 
luctors and 
after testing 
Ising X-ray 
r could be 
Estimating 
1g the high- 
by way of 
suggests a 
pe simply a 
ffer enough 
free: 500°C 
caused by 
the sample 
, originating 
600°C | 700°C 
800°C | ROG" 
O4+5 after a 
lines mark Fig. 4: SEM-pictures of silver films on a LazNiOas+s substrate after annealing for 24 hours 
between 500 and 800°C (see labels). The top left picture shows a freshly deposited Ag- 
layer. The bottom right backscatter image offers enhanced material contrast showing Ag- 
agglomerates as light gray patches on exposed nickelate substrate. 
- short-term Visual inspection of sample surfaces after annealing showed a marked transition from the 
yecimens of reflective surface of a freshly deposited silver metallization to Ag-films of a rather dull and 
sample was lackluster apperarance. SEM-images of the sample surfaces after annealing are presented 
01 bar pOa. in Fig. 4. For comparison a freshly deposited silver film has been analyzed, confirming that 
in order to a homogenous and dense layer is produced by the sputtering technique (Fig. 4, top left). 
After thermal pre-treatment extensive restructuring and agglomeration of the initially 
homogenous silver layer has taken place at all annealing temperatures. Surface