332 Prakt. Met. Sonderband 52 (2018) 
LITERATUR 
[1] Dimiduk, D. M.: Mater. Sci. Eng. A, 263, 1999, p. 281 
[2] Clemens, H., Wallgram, W., Kremmer, S., Güther, V., Otto, A., Bartels, A.: Adv. Eng: 
Mater., 10, 2008, p. 707 
[3] Clemens, H., Mayer, S.: Adv. Eng. Mater., 15, 2013, p. 191 (CE 
[4] Mayer, S., Erdely, P., Fischer, F. D., Holec, D., Kastenhuber, M., Klein, T., Clemens; ES 
H.: Adv. Eng. Mater., 19, 2017, p. 1600735 
[51 Murr, L. E., Gaytan, S. M.: In: Comprehensive Materials Processing, Elsevier, 10, 
2014, p. 135 
[6] Körner, C.: Int. Mater. Rev., 61, 2016, p. 361 BTR: 
[7] Schwaighofer, E., Clemens, H., Mayer, S., Lindemann, J., Klose, J., Smarsly, W., 
Guther, V.: Intermetallics, 44, 2014, p. 128 fo ro 
[8] Schwerdtfeger, J., Korner, C.: Intermetallics, 49, 2014, p. 29 iE 
[91 Klassen, A, Forster, V. E., Juechter, V., Kérner, C.: J. Mater. Process. Technol., 247, dr 
2017, p. 280 on + 
[10] Schioffer, M., Schmoelzer, T., Mayer, S., Schwaighofer, E., Hawranek, G., J 
Schimansky, F. P., Pyczak, F., Clemens, H.: Pract. Metallogr., 48, 2011, p. 594 Ce 
[11] Ence, E., Margolin, H.: J.0.M., 6, 1954, p. 346 . 
[12] Seeger, J., Klein, J., Mecking, H.: Pract. Metallogr., 27, 1990, p. 236 7% 
[13] Schwartz, A. J., Kumar, M., Adams, B. L., Field, D. P.: Electron Backscatter ee 
Diffraction in Materials Science, Springer US, 2009 oe 
[14] McCusker, L. B., Dreele, R. B. von, Cox. D. E., Louér, D., Scardi, P.: J. Appl. Cryst., ne 
32, 1999, p. 36 "a 
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