Papers for the international symposium Commission VI

sitek, zbigniew

Bibliographic data

Monograph

Persistent identifier:: 84215471X

Title:: Papers for the international symposium Commission VI

Sub title:: Kraków, Poland, 8 - 9 August 1978

Scope:: 199 Seiten

Edition title:: Wyd. 1

Year of publication:: 1978

Place of publication:: Kraków

Publisher of the original:: Akad. Górniczo-Hutnicza im. S. Staszica

Identifier (digital):: 84215471X

Illustration:: Diagramme

Signature of the source:: RT 3604(1978)

Language:: English

Usage licence:: Attribution 4.0 International (CC BY 4.0)

Editor:: Sitek, Zbigniew

Corporations:: International Society for Photogrammetry, Commission, 6; Akademia Górniczo-Hutnicza Imienia Stanisława Staszica w Krakowie

Adapter:: International Society for Photogrammetry, Commission, 6; Akademia Górniczo-Hutnicza Imienia Stanisława Staszica w Krakowie

Founder of work:: International Society for Photogrammetry, Commission, 6; Akademia Górniczo-Hutnicza Imienia Stanisława Staszica w Krakowie

Other corporate:: International Society for Photogrammetry, Commission, 6; Akademia Górniczo-Hutnicza Imienia Stanisława Staszica w Krakowie

Publisher of the digital copy:: Technische Informationsbibliothek Hannover

Place of publication of the digital copy:: Hannover

Year of publication of the original:: 2015

Document type:: Monograph

Collection:: Earth sciences

Chapter

Title:: PAPERS FOR SESSIONS OF COMMISSION VI

Document type:: Monograph

Structure type:: Chapter

Chapter

Title:: ORTHOPHOTOGRAPHY IN ASPECTS OP ECONOMICAL ANALYSIS Prof. Dr. Zbigniew Sitek [...]

Document type:: Monograph

Structure type:: Chapter

Zusammenfassung In diesem Berioht wurden die teohnisohen Daten die vom Charakter der Kartenbearbeitung abhängig sind erörtert« Es wurden folgende Probleme dargestellti - das Prinzip der Konstruktion örthophotografiesoher Instrumente, ~ Anwendung der Instrumente bei der Kartenbearbeitung, - Genauigkeitsforderungen der Ortophotokarten* Ausserdem wurden folgende äkonomisohe Parameter der Orthophoto- karten ero M rtert t 1 « Introduction All methods of maps compilation and measurement execution create technical, financial and economical problems* This is extremely significant in orthophoto technique* The cost of orthophotomap production is a factor whioh in reality makes this method different from other technologies used at present* The cost is directly connected with instrumentation and the speed of operation* However, the expenses for photogrammetrio field works are similar in all methods - when the same kind of aerial photographs is considered* But the cost of the remaining photogrammetric work is different and depends on the instru mentation used, the length of time involved in performing this wçrk, productivity of the staff and performance of equipment* 2* Technical data conditioned by the quality of map compilatio n. Economical aspect in orthophotography [1] is connected with the instruments adaptation to the quality and range of map production* Several factors will have influence in this case* The first is conditioned by assumptions concerning construction principles of orthophoto instrumentation* It is well-known that the stereoscopic terrain model is the base for the measurements when photographs are concerned* This stereoscopic model can be reconstructed in an analogue or analytical way* Both methods are now parallelly used* Taking into consideration that the analytical solution will be the best in the future we have to remember about commonly used analogue plotters* Therefore, the builders of orthophoto instruments are obliged to design the orthophoto countershafts for these plotters* Analytical solutions are till now limited by the comparatively high price of analytical plotters* The way of photographic picture rectification into orthophoto has a fundamental influence on the device construction* Optical rectification is now in common use, however electronic systems for transportation and transformation of the picture are in successful development* The question of the width of rectified strips in optical rectification or size of analyzed elementary surfaces in electronic systems is here combined* 101

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