Full text: Proceedings of the Congress (Part 1)

IV L 1 — 291 G. P. Le Divelec, Italy: Checking methods for photogrammetric maps. 
IV LB 2 — 33 G. P. Le Divelec—G. Biscaccianti, Italy: Contribution aux études pour 
l'application de la photogrammétrie aérienne aux levés urbains à grande 
échelle. 
IV L 3 — 102 G. P. Le Divelec, Italy: Essai contrôlé n. 2 »Vercors». Utilisations des 
clichés obliques. 
IV M 1 — 255 S. G. Môller, Sweden: A method to combine geodetic and photogrammetric 
methods with the use of photographic interpretation and helicopter at re 
allotment of forested land. 
IV M 2 — 257 0. S. Makar: Die neue parallaktische Feinpolygonometrie. 
IV T 1 — 37 G. C. Tewinkel, USA: Hydrographic application of photogrammetry in the 
United States Coast and Geodetic Survey. 
IV W 1 — 292 G. D. Whitmore, USA: Economic factors in the integrated photogramme 
tric system of the US Geological Survey. 
V В 1 — 308 
V CV 1 — 51 
V E 1 — 307 
VF 1 — 138 
V H 1 — 321 
V H 2 — 309 
V К 1 — 320 
VL 1 — 318 
V M 1 — 136 
V M 2 — 53 
VR 1 —139 
VS 1 — 319 
V W 1 — 50 
V Y 1 — 137 
Commission V 
T. E. Blesh, USA:* Postural analysis of Yale University Freshmen. 
F. J. G. Cattelain—P. Vermeir: Relevés photogrammétriques de Monu 
ments Historiques. 
W. F. Engelmann, USA:* Photogrammetry applied to making sculptured 
portraits. 
K. J. Fairbanks, USA:* Fairchild analyzer. 
В. Hallert, Sweden: Deformation measurements by photogrammetric 
méthodes. 
J. Halsman, USA:* Stereoscopic medical photography. 
P. van de Кату, USA:* Elements of long-focus photographic astrometry. 
G. Lemaire, Belgium: Détermination expérimentale de la précision plani- 
métrique et altimétrique dans la restitution photogrammétrique d’objets 
de petites dimensions. Méthode de calcul de la distorsion. 
E. L. Merritt, USA:* System-testing cinetheodolites by stars. 
G. T. McNeil, USA:* Macrophotogramme try with the Donaldson stereo 
camera. 
L. Ronca, Italy: O.M.I. Homologo-comparator for the survey of spatial 
lines. 
D. B. Scott, USA:* Microscopic topography by means of surface replicas. 
J. II. Wadell, USA:* Photogrammetry and the photography of motion. 
T. Yonkler, USA:* Photometric camera. 
) USA V contains the American papers in Comm. V. They are marked above with an *).
	        
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