ACKNOWLEDGEMENT 
The Author wishes to take this opportunity to thank all M. T. C. staff 
and in particular the production-oriented staff of the Photogrammetric 
Office, without whose efforts this M. T. C. system, and hence, this 
paper, could not be possible, 
A further note of thanks is extended to: 
Mr. J. Brian Turner who co-authored a paper of similar context 
which was presented last year at the semi- annual ASP- ACSM Meeting 
held in San Francisco, and, 
Mr. Dieter Schellens for his assistance in editing the paper.