Full text: Reports and invited papers (Part 3)

PRESENTED CAPABILITIES OF 
ANALYTICAL PLOTTERS 
. ACCURACY 23 pm with "self calibration” with grid 
CORRECTION OF SYSTEM. ERRORS 
a) film shrinkage 
b) radial distortion film oorr. 
c) asymmetric radial distortion 
d) earth curvature effect on z 
e) refraction effect on z 
| model corr. 
. PLOTTING LIMITATIONS EXTENDED 
a) focal lengths 
b) model to plot scale ratio 
c) oblique photos trig. funetion routines, Dove prisms 
Zoom 
  
SPECIAL RESTITUTIONS 
a) reconnaissance photos special 
b) panoramic photos R.T. portion 
c) radar images, MSS images required 
  
SEMIAUTOMATIC ORIENTATION 
a) int. orientation (with reseau grid, fiducials) 
b) relat. orientation 
c) abs. orientation 
  
SEMIAUTOMATIC POINT LOCATION 
a) grd. pts. 
b) model pts. 
e) photo pts. (left or right) 
  
. AUTOMATIC DRAWING 
a) point plot | drawing 
  
b) line plot (grids, straight software 
lines, ourves) 
. DIGITAL DATA STORAGE 
a) DTM elevations } pt. or profile mode or contours 
b) coded points : (^s, At, Ax, Ay) 
c) coded lines } interactive check desirable 
  
Table_5 
They show improvements over standard type instruments in that 
they permit 
1. higher accuracy by self calibration 
e 2. correction of various types of systematic errors (film, model) 
5. the extension of plotting limitations 
(focal length, enlargement ratio) 
4, the possibility to program for special sensor types 
 
	        
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