364
Fig. 5. Example of the performance of the nonlinear preprocessing in the case of a low diffusivity of the
target surface. 5.a: Image of the acquired pattern after the linear normalization; 5.b: Effect of the
nonlinear preprocessing.
Figs. 6 and 7 show the performance of the algorithm for profile reconstruction, in the case of the elaboration of the
images in Figs. 4 and 5 respectively. In the experiment of Fig. 6 the geometric system parameters are L-5m and
d=1m, while the profile in Fig. 7 has been calculated for L= 1m and d=0.3m.
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Fig. 6. Profile calculated by elaborating the Fig. 7. Profile calculated by elaborating the image of
image of Fig. 4. Fig. 5.
3.2. Analysis of the systematic errors and calibration of the system
A study of the systematic errors has been performed (Biancardi et al., 1995). The influence of the inaccuracy in the
estimation of parameters L, d and p on the measurement error has been investigated in order to (i) understand the
criticality of the parameters involved in the measurement, (ii) provide some means to estimate the measurement error
for a system of given set-up parameters, and finally (iii) provide suitable compensation procedures, to be used during
the system calibration phase. The analysis performed shows that the height error of the coordinate z(x,y) is markedly
influenced by the error made in the evaluation of the actual value of the period p used for projection, while the effect of
errors on the estimate of parameters L and d, is two orders of magnitude smaller. This behavior suggests that, during
the system calibration, it is possible to even markedly decrease the height error, simply by finely varying the estimate of
p.
Calibration is performed by using a master object, similar to that shown in Fig. 4. Thirty-six points have been selected
on its surface. A Contact Measurement Machine (CMM) has been used to measure the master in correspondence to
this set of points. A suitable procedure allows us to compare the profile of the object, as it is evaluated by the optical
profilometer, with the measurements obtained by means of the CMM. In our system, parameters L and d are
measured to the desired accuracy during the set-up phase of the system, before calibration. During the setup, the
estimate of the parameter p is determined by a suitable algorithm. The resulting value is used as an input for the
IAPRS, Vol. 30, Part 5W1, ISPRS Intercommission Workshop "From Pixels to Sequences", Zurich, March 22-24 1995
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