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ACKNOWLEDGEMENTS 
I am especially indebted to Prof.G.Vieth and Dr.D.Hoeschen, PTB Braun- 
sehweig, who gave me the opportunity of performing the reference measure- 
ments. Furthermore I wish to thank Prof.G.Hildebrandt, University of 
Freiburg/Br., and Prof.W.Hofmann, University of Karlsruhe, for granting 
me the permission to use instruments of their institutes. I also thank 
H.P.Grótsch and G.Sedlaezek for preparing the step wedges and for Carry- 
ing out the laboratory work, Ing.gvad. K.Klein for performing numerous 
measurements, and Mrs. Ing.grad. H.Ruthotto for assisting me in the eva- 
luation of the results. The translation was kindly assisted by Mrs.R.Büttner. 
LITERATURE 
American National Standards Institute, Inc. » 1959: American National ($ 
  
Standard PH2.19-1959 Diffuse Transmission Density, New York. 
DIN 4512, Sheet 3, 1973: Photographische Sensitometrie, Bestimmung der 
optischen Dichte von durchlássigen streuenden Schichten, Berlin. 
Frieser, H., 1975: Photographische Informationsaufzeichnung, R. Oldenbourg, 
  
München-Wien, Focal Press, London-New York. 
Heiland, W., Vieth, G., 1961; Messungen des Callier-Quotienten von Farb- 
  
Umkehrfilmen, Photographische Korrespondenz 100, p.3-6. 
International Organization for Standardization, 1974: ISO 5-197k 
  
Photographic Determination of Diffuse Transmission Density, Paris. 
Mees, C.E.K., 1959: The Theory of the Photographic Process, 2nd Edition, 
  
Macmillan, New York. 
Mees, C.E.K., 1966: The Theory of the Photographic Process, 3rd Edition, 
  
Editor: T.H. James, Macmillan, New York, Collier-Maemillan, London. 
Swing, R.E., Clay, J.R., 1967: Ambiguity of the Transfer Function with 
  
Partially Coherent Illumination, Journal of the Optical Society (9 
of America 57, p.1180-1189. 
Swing, R.E., 1972: Conditions for Microdensitometer Linearity, Journal 
  
of the Optical Society of America 62, p.199-20T. 
Thomas, W., 1973: SPSE Handbook of Photographic Science and Engineers, 
  
John Wiley & Sons, New York-London-Sydney-Toronto. 
Vieth, G., 1974: MeBverfahren der Photographie, R. Oldenbourg, München- 
  
Wien, Focal Press, London-New York. 
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