Ene 
N p N EE SR SEL 3 Ge SAN WOT SS WT OT A AG NEUE HT 
X J] CRIT OAK A NC NR NG Fine Arf fe 
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M(R) MR) . 
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À - 530nm Scanning 
0,84 N 081\ direction 
: cT MTF of diffraction ole 1 4 
0,61 aghast MTF ! |^ 
044 Li 
021 ~N 
dr LE L t IT 
R'inmm  ——-e 
1,01 1 0- | 
I ) e 
À = 650 nm 
T 
Ne 
200 300 
A= 720nm 
. 
ON 
.* N 
«N 
° a = 
—- + + e — + 
(0 —. 200 300 
Fig.2: MTF-Curves of Pinatar 4/125 
Measuring plane see text