Full text: XIXth congress (Part B3,1)

Ying Chen 
  
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= (2) 
2 1 
W,; fy) f* V»; (x, y) 
The modulus and amplitude angle of gradient vector are defined according to formula (2) respectively as: 
2 2 2 
M,, f Gy) - AW f G XY HW] f Gs») ^ 
2 1 
A, f(x,y) 7 argtan(£., f (x, y) / W,, f (x, y)) 
Choosing two-dimensional Gaussian or B- 
spline as smoothing function, from formulas f(x,y) 
(1), (2) and (3), we can obtain corresponding IL 
wavelets and obtain the modulus M) f(x,y) Wavelet 
and amplitude angle AJ f(x,y) of gradient : 
iss 2 translation 
vector in image f(x,y) respectively. Then, 
image gradient and direction map (g map 
and d_map) can be generated from M; f(x,y) G map d map 
and A, f(x,y). This is the foundation for the 
gradient direction profile detection algorithm AL Gin 
presented in this paper. First, the modulus Decomposition & 
whose absolute value is maximum is detected reconstruction 
along gradient direction. Through tracing and 
connecting the points where the modulus and 
direction are the most approximate, the edge Profile searching 
contours are obtained and expressed by chain 
code. Figure 1 shows the detection procedure. i L 
Most matching algorithms are done in chain code 
pyramid images. The pyramid images in this Jil, 
paper are generated using decomposition and 
reconstruction base on wavelet. The set of Edge trace 
decomposition for image f can be given T T 
[Ying,1998.12], 
i Fearture contour 
FH TE 
di^zGH/ line moment 
a (4) parameters 
d°=HG;" JL 
dt = GO 1 Matching 
Fig.1: Edge Detection Procedure 
The set of reconstruction can be written 
eB Hr +H ACI” + GG d** (5) 
The results of decomposition and reconstruction are expressed as figure 2. 
A remarkable property of wavelet Transform is its ability to characterize the local regularity of functions.The regularity 
indicates a singularity of image feature and can be often measured with Lipschitz exponents a . Mallat[1992] have 
demonstrated that the maximum of modulus for wavelet translation must satisfy, 
M, f(x,y) < AQ) 
  
178 International Archives of Photogrammetry and Remote Sensing. Vol. XXXIII, Part B3. Amsterdam 2000.
	        
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