Full text: Proceedings, XXth congress (Part 5)

   
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International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, Vol XXXV, Part B5. Istanbul 2004 
where C is the projection center, el and e2 are arbitrary 
orthogonal vectors within the circle plane, M is the midpoint of 
the circle and r the circle radius. Using the well known 
coplanarity equation 
f x 
R 
: Hi 
y |=R-(X-C)=R ui 
R 
2 (x = C) 
. ; 
the cone can be transformed into image space by 
x=A-r-R-(cosa-e, +sina-e,)+1-R-(M-C) (12) 
The intersection of Equation 12 with the image plane is simple. 
The plane is defined by z = -c. Hence, À can be obtained from 
€ (13) 
A-— 
R,-(r:cosa-e, *r:sina-e; « M- C) 
and the coordinates of the intersection figure follow as 
  
  
R,:(r:cosa:e, * r-sina-e; - M- C) R,:v 
Xz-—C m—C 
R,-(r-cosa-e +r-sina-e, +M-C) R,-v (14) 
R, -(r-cosa-e, +r-sina-e, +M-C) R,v 
y=-c—== m 
R,-(r:cosa-e, *r:sina-e, - M- C) R,-v 
If Equations 14 can be transformed so that the parameter a is 
eliminated, the implicit form of the ellipse equation (15) is 
found. The derivation is lengthy and only the final form of the 
implicit parameter is presented here: 
  
  
  
2 y 
a-x>+b-xy+c-y +d-x+e-y—-1=0 (15) 
2 2 2 2 
rm, -n,-n 
a= 1 = 21 
d 
be r^ qm nac. n Wi 
d 
2 2 2 2 (16) 
yf mh. ny 
Cm M Z2 
d 
„2 l^ - 
Bal ol HH Ha Ps — May Has 
d 
PR, ity, Hg 
ez2:c BEER 
d 
where the following substitutions have been used: 
m zR,e, R,e,-R, e, R,e, 
m,zR,e, R,e, -R,e,-R,-e, 
m,-zR,e,R,e;-R, e, R,.e, 
n,-R, eR, (M-C)-R, e,- R, (M-C) 
n,-R,e,R,(M-C-R,e,R,-(M-C) (17) 
R,-(M-CO)-R,-e,- R,- (M-C) 
n,-R,e,R,(M-CL-R, e, R, (M-C) 
n4-R, e, R,(M-C)-R, e; R, (M-C) 
n,-R, e, R, (M-O)-R, e, R,-(M-C) 
= 2 2 2e 2 
dzcln.tm.-r-:m, 
n;=R,-e- 
Thus, a description of the implicit ellipse parameters dependent 
on the circle parameters is found. For the target plane 
adjustment, linearisation with respect to the circle parameters 
(M, r, el and e2) is required. 
The chosen parameterisation of the circular target by midpoint 
M, radius r and circle plane vectors el and e2 consists of 10 
elements. However, a circle in 3D can generally be described 
by 6 parameters, i.e. midpoint, radius and two rotation angles. 
Hence, the selected parameterisation has 4 degrees of freedom 
which have to be eliminated within the adjustment. One 
possibility is to introduce constraints. This was implemented in 
the developed process in Australis. There, the length of the 
vectors el and e2 was fixed to 1 and the orthogonality of el and 
e2 was secured. The final constraint prevented el and e2 from 
rotating within the plane of the circle. 
Since the observations for this adjustment were created by a 
previous adjustment, the previously computed covariance 
information can be incorporated as well. Tests have shown that 
this is an absolute requirement for the computation of an 
accurate target plane since the implicit ellipse parameters have 
different scales and different accuracies (for introducing full 
variance/covariance matrices, see Mikhail et al. 1996). 
Finally, it should be mentioned that the first adjustment delivers 
explicit ellipse parameters whereas the target plane adjustment 
takes implicit ellipse parameters. The required conversion of 
the parameters and of the covariance matrix is shown in the 
appendix. 
3. QUALITY ANALYSIS OF THE TARGET PLANE 
DETERMINATION PROCESS 
For the quality analysis of the developed target plane 
determination process an object with a precisely known surface 
shape was surveyed. The test field was placed on a calibration 
table which had a machine-levelled surface. The table was 
kindly made available by Boeing Australia Limited at a factory 
in Melbourne. The main aim of the test field was to investigate 
the target size effects and the accuracy of determining the target 
normal. 
The targets of the test field were arranged in a 4 by 4 grid, and 
four different target sizes were used (3, 5, 6.4 and 9.4 mm). 
Thus, the test field consisted of 64 inspection targets and some 
additional system-required targets (Figure 8). 
  
Figure 8: Test field on machine-levelled surface. 
    
  
  
  
  
   
    
  
  
  
  
   
   
    
    
  
   
     
    
   
   
   
  
  
   
  
    
    
    
    
     
    
   
  
  
   
  
  
  
  
   
    
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