In table 6 the line widths and their standard devi-
ations are presented for the different systems and
different zoom settings.
Table 6 and figure 6 show that when zooming in 2.
with system 1, the line width decreases from 44 to
20 microns. The reason is that superimposition
takes place nearby the occulars.
For the systems 2 and 3 zooming takes place near-
by the photo and therefore the line width is con-
stant, respectively 25 and 76y. It was not possible
for all systems to use the same illumination factor. 3.
Therefore it is possible that some lines have been
measured relative thicker. The measuring results
show that there is no relation between the line
width and the line direction. To show this depend-
ence the standard deviation of the measurement
should be smaller.
4.
System Zoom
1 10x
20x
40x
10x 76
20x 74
Table 6. Line width at photo scale for different 5.
systems and zoom settdings. n = number of lines;
d = line width in microns; 0 = standard deviation
of line width measurement (microns).
width 60
in u
50 -
A
| 404
| 304 = ET. 20 x 6
| P s Es «t
201 "^ t es N ALL
= Dé 40 x
10-1
0 0 125 25 37.5 50 62.5 75 875 100
—— ——»- line direction (grads)
Figure 6. The line width of system 1 for different 1.
zoom settings.
2.
4. CONCLUSIONS AND RECOMMENDATIONS
1. The superimposition accuracy at the position of 3.
the measuring mark through the whole stereo-
model for the three tested systems varies from
9 to 28 micron at photo scale (table 3).
568
If corrections are applied for systematic devi-
ations then the accuracy varies from 5 to 22
micron.
Superimposition through the whole field of
vieuw shows large systematic deviations (fig.
4). If these systematic deviations can be
removed by system calibration then the accu-
racy for the three systems varies for magnifica-
tion factor 10 from 10 to 24 micron at photo
scale (table 5).
The width of the superimposed lines for dif-
ferent zoom settings is presented in table 6.
For the systems 2 and 3 the line width is con-
stant and is respectively 24 and 75 micron at
photo scale. For system 1 the line width
decreases from 44 to 20 microns when zoom-
ing in from 10 to 40 times.
The results of the research show that error
detection of feature coordinates with
superimposition is possible in a limited way.
If the superimposition accuracy varies from 20
to 40 micron in the photo than this accuracy is
two to three times worse than the
photogrammetric measuring accuracy of points
which describe hard topography. One must
keep in mind too that when using mono-
superimposition the detection of errors is diffi-
cult if errors are present in the Z-coordinates of
the data base. These Z-coordinate errors are
presented in the photo as x- and y shifts.
In order to detect Z-coordinate errors stereo-
superimposition is necessary. Through the high
requirements of resolution, frequency and
image synchronisation however, stereo-
superimposition requires much more processor-
and memory capacity, which is also reflected in
the price.
A supplementary solution for the detection of
errors which are present in the database could
be to use the 'move to' routine of the analyti-
cal plotter. When the operator does not trust a
certain object (because f.e the superposition is
not optimal) then he can check these points
with this routine. The 'move to' accuracy lies
between 3 to 10 microns at photoscale. When
using the ‘move to’ routine with only X, Y data
base coordinates the operator himself has then
to set the measuring mark on the terrain.
It is recommended to calibrate the superimposi-
tion systems if the purpose is to use them for
the detection of large database errors. This has
been shown by the results as presented in
paragraph 3.3.
5. LITERATURE
Persie, M. van, Superimpositie. Beschrijving,
precisie toepassingen. Afstudeerscriptie, Fa-
culteit der Geodesie, TU Delft, februari 1991.
Witmer, R.C.J., Beeldinspiegeling: een hulp-
middel in de fotogrammetrie. NGT Geodesia
1991-7/8.
Bonjour, J.D., Eital, G. Kóbl, O., 1988, Experi-
ences with the Wild System-AP and its Stereo
Injection Verification System, Proceedings
ISPRS, Commission V, Kyoto.