edge
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ing,
ning
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dth.
alue
ver-
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08
nore
part
lump
hich
are
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et. 8
the
of
hich
nary
the
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And
are
ined
age.
the
THM
the
ghly
and
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ping
The
rack
each
hich
cing
on
iled
crack vectors and precise width can be
generated. At the end of crack measure-
ment processing, coordinates of crack
vectors and scale of width are rectified
using to the fiducial points arranged on
concrete.
Crack measuring process is divided into
five stages; mapping crack vectors,
thresholding, noise reduction, detailed
positioning and measurement of crack
width (see Fig. 6).
À previous processing of crack measuring on a coarser image
Coarse crack
vectors and
width
Finer crack
vectors are
generated and
width is
measured.
Finer crack
vectors and
width
+
À following processing of crack measuring on a finer image
Fig.5. A schema of hierarchical crack measuring
Start
(rm
Mapping crack vectors |
I
Thresholding =
I
I
Detailed positioning |
I
|
|
| Noise reduction |
|
|
Measurement of crack width |
repeat until finishing
on the original image
| Rectification of scale |
I
End
Fig.6. The flow chart of hierarchical
crack measuring algorithm
3.1 Mapping crack vectors
Each vector of cracks is mapped onto the
image one step finer than the present
image. Because the ratio of resolution
between these images is 2:1, the location
of mapped vector has an ambiguity in
area of 2x2 pixels (see Fig. 7).
À crack vector on a present
image
Àn ambiguity in area of 2 X 2
pixels on a one step finer image
Fig. T. Ambiguity of mapping
3.2 Thresholding
A threshold value is determined by the
method based on discriminating and least
squares criteria suggested by Ohtsu
(1980), following which the finer image
is thresholded into a binary image.
A threshold value of each crack vector is
calculated in an elliptical target shown
in Fig. 8, which the major axis of the
ellipse is directed along the crack. In
order to accomplish an adequate calcula-
tion, the length of the minor axis is
determined to be twice or three times of
the crack width which has been computed
on the present image.
It is noted that the initial crack width
on the coarsest image can be determined
from the number of execution times re-
quired in thinning process.
A
Lr
À crack on a finer image
Elliptical target in which
threshold is computed
A length varies in propotion
to the crack width computed
in previous processing.
A
EO ©
e
_
A crack vector
Fig. 8. An elliptical target for thresholding
3.3 Noise reduction
Fig. 9 shows an example of small isolated
holes in the thresholded area. These
holes, which usually prevent detailed
positioning of crack vectors and precise
measurement of crack width, must be
filled.