Full text: XVIIth ISPRS Congress (Part B5)

    
   
  
     
   
    
   
    
     
   
    
    
     
     
  
  
   
      
4D-LASER SCANNING FOLLOWED 
BY 
INTERNAL COMPUTER MODEL GENERATION 
Ph. Hartl, A. Wehr Institute of Navigation, University Stuttgart 
, 
Germany, Commission V 
G. Pritschow, M. Ioannides Institute for Control Technology for Machine 
Tools and Manufacturing Systems, University 
Stuttgart, Germany, Commission V 
ABSTRACT: 
A 4D-laser mapper has been developed, which samples synchronously Cartesian coordinates 
with sub millimeter accuracy and the laser intensity reflected from the target's surface. 
The array of point measurements data are processed by a program module so that the’ 
geometry of the object’s surface is described. These transformed data can well be used by 
normed interfaces e.g. IGES and VDAFS and linked to CAD/CAM-system for further processing. 
By imploying the 4D-laser mapper and the special post processing software the process from 
carrying out the measurement to storing valid CAD/CAM-data of any object lasts only 
minutes. 
The 4D-laser mapper and the new program module will be presented. Typical measurement and 
manufacturing results will be shown and discussed with respect to application in CAD/CAM. 
KEYWORDS: Laser Mapper, CW Semiconductor Laser, 3D-Measurements, 3D-Reconstruction, 
Dublicating Milling Machine, Sculptured Surfaces, CAD/CAM/CAP/CAQ 
1. INTRODUCTION 
universitily of the quality control loop could be 
improved drastically, so that the manufacturing 
loop could be accelerated and rationalized. This 
would result in reduced manufacturing costs and 
The rapid changing market and the steadily raising 
quality requirements demand very flexible and fast 
process and quality control loops. This is import- 
         
        
   
  
     
   
   
   
    
    
ant especially regarding the improvement of quali- 
ty standards new and advanced measurement and ma- 
nufacturing strategies must be developed. Flex- 
ible, high precision and robust sensors are re- 
quired for the registration of measured values. 
These devices should operate directly at the 
manufacturing machine and should be linked with 
Computer Aided Design (CAD) / Computer Aided Manu- 
facturing (CAM) systems by a well defined hard and 
software interface, in order to obtain a direct 
connection to higher level Computer Integrated 
Manufacturing (CIM) systems. Only in this case 
@ = very high 
® = high 
Q = middle 
©" optical 
Q = very low 
non contacting sensors 
new products could be delivered on the market in 
shorter intervals. 
Today  non-contacting and contacting (tactile) 
sensors are used in the production measuring tech- 
nique of the machine-tool and molding industry (s. 
fig. 1-1). The non-contacting measuring systems 
can be classified in optical and  acoustical 
methods. If the measurement is carried out by 
optical means, laser triangulation, holography, 
interferometry or photogrammetrical methods are 
employed. Acoustical range measurement are re- 
Scanning Methods 
daz m RAT TE 
contacting sensor 
i 
acoustic !mechanical 
Ne tar Pu 
mechanical scarining sensor 
  
  
Triangulation Holography Interferometry Photogrammetry Ultrasonics 
n ra 
LL 
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
accuracy 
  
resolution 
  
range 
  
technical expense 
of the instrument 
  
cost$ 
  
vibration 
sensitivity, 
  
sensitivity to ; 
dust, coolant drains 
  
data errors 
  
appl. with refl. 
- objects 
  
Realization in 
product.- machines 
0690060096 
000020000090 
0 0060050000 
  
  
  
  
  
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ee. O/OOCO|/,/OO t- 
090090000000 
  
  
  
  
Fig. 1-1: Overview of Current Digitizing Methods
	        
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