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Fig. 3.2-2: 3D-NC-Simulation of a 100x100 Points 
Digitized Object 
Employing ASMOS the resulting data of 
workpiece can directly be en one hang Se 
CNC-Simulation of the cutter path of a five axes 
milling machine (s. fig. 3.2-2) and on the other 
hand for direct milling the workpiece. 
Using the 4D-LM and applyin resented 
surface modelling algorithms g Ore ze Does 
application field of CIM and especially of CAQ and 
CAM to close the manufacturing loop (S. fig. 3.2- 
33 very effiently. E.g. total cycle from mapping 
he master piece to generating freeform surface 
oriented CNC-data takes less than 2% minutes for 
the test object shown in fig. 3.2-2. 
    
    
      
   
     
    
  
      
  
    
Design Vernetzung Konstruktion 
DRESS mm nh 
44) = CAD 
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steuern - 
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x v 
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i HP 9000/720-ISWAXS 
JES-O.pic 
Fig. 3.2-3: Typical Industrial Production Loop 
4. CONCLUSIONS 
A new non-contacting optical four dimensional 
measurement system was presented. It could be 
shown that due to its high measurement accuracy in 
the submillimeter range the device can be used in 
the application area of manufacturing. However, to 
make optimum use of the 4D-LM a new sophisticated 
modelling software package was developed which 
regards the special scanning strategy of the 
mapper. Due to the computer internal represent- 
ation of the scanned data it possible to shorten 
drastically the cycle time from prototyping to 
mass production. This is a key requirement of to- 
days manufacturing industry. The presented system 
realisation reduces production costs and improves 
the productivity and the quality. 
In future development steps we will focus on 
volume oriented digitizing, modelling and pro- 
cessing. Then we will be able to carry out solid 
nominal-actual value comparison. In addition it 
will be studied if the measurement results could 
be improved by applying image processing and 
recognition techniques. 
REFERENCES 
Olomski, J., 1989. Bahnplanung und Bahnführung von 
Industrierobotern. Dissertation TU Braunschweig. 
Vieweg & Sohn, Braunschweig/Wiesbaden. 
Wehr, A., 1989. 3D-Mapping by a Semiconductor 
Laser Mapper and its Application Possibilities. 
In: Optical 3-D Measurement Techniques, Eds 
Gruen/Kahmen, Herbert Wichmann Verlag, pp. 180-195