Full text: XVIIIth Congress (Part B1)

nperature 
varying 
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ly source 
rough a 
pectrally 
spectral 
M-WIP 
ackbody 
spectral 
| wafer. 
. the M- 
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ackbody 
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T 
EN | 
  
900 
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ited the 
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CONCLUSIONS 
e A multi-wavelength imaging pyrometer (M-WIP) was 
presented for remote sensing of temperature profiles of 
gray and color targets with unknown emissivities and 
software package was developed for calibration and real- 
time M-WIP measurements. An experimental 7-filter 
line-sensing M-WIP system was implemented with a 
320x122-element non-interlaced PtSi IR-CCD 
radiometric camera capable of operation with optical 
integration times ranging from 0.12ms to 12 s, thus 
providing wide dynamic range. 
e After calibration. against a commercial blackbody 
reference source in the temperature range from 500?C to 
950°C, temperature resolution of +1°C was 
demonstrated with the experimental M-WIP system for 
real-time temperature measurement of the blackbody 
source in the temperature range from 600?C to 900?C. 
e The study of the accuracy of M-WIP temperature 
measurements for targets with spectrally varying 
emissivity was conducted using  double-polished 
silicon wafer placed in the optical path of M-WIP 
system. Temperature resolution of x4°C was 
demonstrated with the experimental M-WIP system for 
blackbody source viewed through the double polished 
silicon wafer with unknown spectral transmissivity in 
the temperature range from 500°C to 950°C. 
e To achieve the above performance, the radiometric IR- 
CCD camera was operated with black level and 
background subtraction, a compensation for dark current 
charge corresponding to radiant target and background 
signal levels (including correction for the variation af 
SBD dark current with signal level), and correction for 
saturation non-linearity of the imager response as 
function of the accumulated signal and the intensity of 
the incident radiative flux. 
ACKNOWLEDGMENTS 
This work was supported by the US Air Force 
Wright Laboratory and the ARPA  Microelectronics 
Technology Office under Contract No. F33615-92-C- 
5817. 
REFERENCES 
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IEEE International Symposium on Industrial 
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83 
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9. N.M. Ravindra, et. al, "Development of Emissivity 
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10. N.J. McCaffrey, "Design of a 320X122 MWIR-CCD 
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Integration Time Control Masters Thesis, New 
Jersey Institute of Technology (1993) 
11.M.A Khan, et. al, "Noncontact Temperature 
Measurement: Least Squares Based Techniques," Rev. 
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International Archives of Photogrammetry and Remote Sensing. Vol. XXXI, Part B1. Vienna 1996 
 
	        
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