Subgrain Boundary Migration in Aluminium 
D. H. WARRINGTON, S. EXELL 
(University of Sheffield) 
A new and sensitive metallographic method utilizing the Normarski technique has been used 
to observe the migration of subgrain boundaries in polycrystalline aluminium. The Schultz 
X-ray topograph technique was used to obtain subgrain boundary misorientations. From the 
quantitative data obtained it has been shown that the subgrain boundary migration accounts 
y for approximately 60 % of the total strain in secondary creep and that the activation energy 
and stress dependence of migration velocity are in agreement with the macroscopic 
dependence of strain rate on temperature and stress. Some conclusions are drawn on the 
implications of these observations. 
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