5201
"_- = ; m grain 2: <1-11>- tensile axis
=e z A gain 3: <2-11>- tensile axis
ke elector % 15 & gan 4; <3-22>- tensile axis
Splacemente ' e grain 5: <1 00>- tensile cxis
dal stresses 9
related to "10 A
15s, Stresses
ler are found in
il =
"On radiation
Search project, a a
ba ;
’ 30,0 40,
op load stress ¢' [MPa]
5 !
Figure 1: Linear Dependency of Load Stress oc! and Electromagnetically Determined Residual
; magnetic Stress o' gy in Individual Grains
n or smaller,
pulation The residual stress values recorded by the Barkhausen Noise Eddy Current Microscope can be
nation displayed as line- or area scans.
hausen Noise
ng. Inthe
= in
© 30 = =a
2 ] —
th | x“
, 20 ir.
dual micro- 5 | aa YY NLA
system, © T ] a
le testing -- ha Wi
tion using a ] a
nagnetic 0 © | 2,1
jographically x [mm]
s are displayed |
s 12 caused Ce
rements 2 7
aid 0 SE ——
lv expected. | X
Figure 2:External Load o' and Residual Stress of the Second Order oc", established by BEMI and
XPA Inside Individual Grains of Different Crystal Orientation. XPA only delivers a mean
value per grain. The Residual Stress Distribution "gum is represented by Line-Scans
through the Center of Grains 1-5 of the Nickel Specimen. The Standard Mean Deviation of
ol. and o'lyps is 2.7MPa.
10,0 20,0 ;
101