Prakt. Met. Sonderband 38 (2006) 159 
;oarse 
Fig. 4: lon induced SE image of FIB prepared cross-section at the free surface of the ribbon; 
a) 3D micragraph of sputtered volume; b) higher magnification of the area of interest 
/ um thick 
mai a Closer examination with ion induced SE image (Fig. 4b) as well as SEM images confirmed 
> and fine that the 3D FIB preparation results in sharper edges, better contrast and higher detail 
he bulk of resolution in the area of interest than obtained with the standard metallographic preparation 
1d pattern of the cross-sections. It can be seen also that the Cu-Zr intermetallic particles are much finer 
d a longer than those visible in the Figures 1b and 1c. The FIB-prepared microstructure revealed the so 
rtical ribs, called precipitation free zone near the grain boundaries which is common whe precipitating 
e area of from supersaturated solid solutions. 
t of 10 pA Unfortunately, the 3D FIB preparation cannot be used for the preparation of the whole cross- 
with well section (a long processing time). Therefore, a standard metallographic preparation of rapidly 
solidified ribbons is unavoidable.