192 Prakt. Met. Sonderband 38 (2006) 
ACNOWLEDGEMENTS 
We would like to thanks Ms. Dr. Paola Pessenda-Garcia from ECHEM for providing the 
deposit of Ni-coatings and valuable discussion. 
The financial support within the ,Kplus Program“ by the FFG (Austrian Research 
Promotion Agency) and the government of lower Austria is gratefully acknowledged. 
REFERENCES 
[1] Schumann H., Oettel H. (Hgst): ,Metallographie®,14. Auflage, WILEY-VCH Verlag 
GmbH, 2005 
[2] Cairney J.M., Munroe P.R., Hoffman M.: ,The application of focused ion beam 
technology to the characterisation of coatings”, Surface & Coatings Technology, 198 
2005, p.165 
[8] Wendt U.: ,Zusammenhang von Krisastallorientierung, Channelingkontrast und 
Sputtertopography untersucht an Cu mittels FIB, EBSD, SEM, AFM“, 1st FIB 
Workshop, Focused lon Beams in Research, Science and Technology, Dresden, 
Germany, 22-23 Mai 06 
[4] Kempshall B. W., Schwarz S. M., Prenitzer B. |., Gianuzzi L. A., Irwin R. B., Stevie F. 
A.: lon channeling effects of the focused ion beam milling of Cu®, Journal of Vacuum 
and Science Technology, B 19 (3), May/June 2001, p. 749 
[5] Froseth A.G., Derlet P.M. Van Swygenhoven.; “Twins in Nanocrystalline fcc Metals”, 
Advanced Engineering Materials, 7 (1-2), 2005, p. 16 
[6] Ungar T, Tichy G., Gubicza J., Hellmig R.J.; “Correlation between subgrains and 
coherently scattering domains”, Powder Diffraction, 20 (4), 2005, p. 366 
[71 Klemm R.; ,Zyklische Plastizitdt von mikro- und submikrokristallinem Nickel“, Ph. D. 
Thesis, Fakultédt Mathematik und Naturwissenschaften, Technische Universitat 
Dresden. 2004