238 Prakt. Met. Sonderband 47 (2015) 
Das U 
MT 1 5 
Abb.4: Makrobild und REM-Aufnahmen von Oberfläche und Schliff einer bei bis 2000°C in Wasserdampf 2 Ee 
oxidierten SiC-SiC; Probe mit Blasenbildung in der SiO,-Schicht. OR 
Literatur 1 EDA 
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