Full text: Commissions III and IV (Part 5)

  
  
     
A Short report of a practical method for 
analytical aerial triangulation 
Abstract: Here will be shown a summary of our 
theory and experiences for analytical aerial trian- 
gulation. 
We set two steps, one is called the semi-analy- 
tical and the other the pure-analytical, for con- 
venience to application. The semi-analytical is 
already in routine work in our factory since more 
than one year. On the other hand, the pure- 
analytical is almost ready to be took in our daily 
work. 
For pure-analytical method, we use one of two 
camera of Autograph A7 to measure photographic 
coordinates, as a single comparator, with the aid 
of point-transfer device designed in our factory. 
A particular feature of our method is that 
computations are done as though we made exten- 
tion on Autograph A8. So that the method has 
an advance also in the point that it gives us 
accurate orientation elements for Autograph AS, 
prior to plotting. 
Content. 
1. Introduction. 
2. Absolute orientation. 
2-1. Absolute orientation. 
2-2. Semi-analytical method. 
3. Relative orientation. 
4. Successive orientation. 
5. Pure-analytical method. 
l. Pure-analytical method. 
2. Analytical aerial triangulation of grid 
plates. 
5-3. Actual example. 
6. Correction for film shrinkage. 
1 C 
er 
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1. Introduction. 
Since several years, many attempts for analyti- 
cal aerial triangulation, especially in the field of 
theory, have been developed and published. But 
it seems that the method has not yet been brought 
   
Ryokichi, Kamiya 
Asia Air Survey Company Limited, Japan 
into practical use. In our factory for these two 
years, the endeavour has been made to make the 
analytical method available to practical use. The 
results from studies and application are shown 
bellow. 
The method may be considered quite useful for 
practical purpose, especially in efficiency. We 
can get the same accuracy by means of the new 
method as by usual mechanical methods. We can 
not yet get higher accuracy at the present step, 
because we employ the horizontally adjusted single 
camera of Autograph A7 for the measurement of 
photographic coordinates, that is, as a single com- 
parator. In other words, mechanical inaccuracy 
which Autograph A7 comprises in itself can not 
be compensated, It, however, rests invariable in 
computation as its essential limit. 
The point transfer device, shown in fig. 1, is 
indispensable for independent measurements of 
photographic image and was designed and accom- 
plished by Mr. T. Kuramochi, one of the staves 
of our company. 
Fig. 1 
Our point transfer device KRP-60. 
  
A medium scale electronic computer such as 
IBM 650 is very convenient for this method. 
The computer which we have been using, is named 
NEAC 2203—all tranzister type computer made in 
Japan. The average time spent for computation 
per model must be less than 4 minute theoreti- 
cally, including all the computation procedures 
necessary to obtain the finally typed out results, 
starting from raw material. But important prob- 
lem lies in the programming for filtering non- 
  
  
  
  
  
  
  
  
  
    
   
   
   
   
   
  
  
   
    
  
  
  
   
  
  
   
  
  
  
   
   
  
   
  
  
 
	        
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