Full text: Photogrammetry for industry

  
      
  
  
  
  
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MAGNIFICATION (xk) 
Figure 2 : Average Angle of Rotation versus Magnification in TEM 
cation 
CONTOURS POINTS 
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1 27.48 4429 tog 1 98.94 : 
æ L& 441 96 2 48, 41 : : 
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7 9790 88 = | 
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1 Divieton = 88 nm Socle = 854944 
Figure 8 : Plot from TEM micrographs at the Photogrammetric Plotting 
System (PPS) 
  
 
	        
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