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1978 ISP COMMISSION V INTER-CONGRESS SYMPOSIUM - STOCKHOLM SWEDEN
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Linkwitz: (Chairman of the Session)
I would briefly like to introduce the subject of the afternoon which is
"The Measuring Task in Industrial Photogrammetry".
We will have altogether six papers, three before the coffee break and
three after, all of which, by typical examples, should give a good picture
of the measuring task in industrial photogrammetry, as it can be solved by
this tool. I would like to make some remarks on this since, from the list
of participants, it is known that quite a number among you are non-photo-
grammetrists, but from industry, and I would like to invite especially
those of you who are non-photogrammetrists to join in the discussion, be-
cause it is from your side that we need assistance and active participation.
I may briefly say that the main advantage of photogrammetric measurement in
industrial applications is that the object need not be touched physically,
and even between the measuring device and the object to be measured, there
may be glass plates or other hindrances, and still a measurement is possible.
Then the second advantage is that many points can be measured simultaneously
so the whole state of a shape or of a deformation can be measured fast and,
by successive exposures, adjacent states of form or deformation can be
measured. Then if we compare photogrammetry as a tool, with conventional
physical means of measurement, in which we touch, or in which we compare
shape with a certain given shape, then we can say that mathematical pro-
cessing of the measurement data in photogrammetry is especially easy, and
advantageous in this task.
The objects may be very small, say as an example in biostereometrics, from
the size of an artificial heart, to a very large facade in structural ap-
plications. The application may be a one-time event for some special task,
or it may be a full photogrammetric system, say, for instance, in quality
control in an assembly line. And the time between the measurement and the
evaluation of data may be, as is normally the case in photogrammetry, from
same days down to, and this would be agoal to be achieved, real time photo-
grammetry. This naturally is not in use to-day, but it is very well possible
that this will develop.
Now I would like to call on our first speaker, Mr. Chisholm, who gives two
contrasting applications, which to me seem very typical for the possibilities
that photogrammetry offers in this field.
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Paper by N. W. T. Chisholm - University of Wales and Fairey Surveys Ltd.
"CLOSE RANGE PHOTOGRAMMETRY - TWO CONTRASTING INDUSTRIAL APPLICATIONS"
Linkwitz:
May I suggest that we directly go over to the paper to be presented by
M. Mayoud of CERN, Geneva, and then have the discussion of both papers,
because they may have common aspects.
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Paper by M. Mayoud - CERN, Geneva
"PHOTOGRAMMETRIC METROLOGY AT THE EUROPEAN ORGANIZATION FOR NUCLEAR RESEARCH"
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