1) 
Or- 
2) 
tal 
ble 
the 
he 
the 
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he 
7). 
" 
he 
an 
  
2h? b (25) 
A xm rM bd * d Pa 
The influence upon the strip coordinates can then be found from the 
corresponding differential formulae. See for instance the expressions 
(4.1), (4.3) and (4.5) in [4]. 
7. The effect of systematic errors in general 
In a similar way as has been used above for the investigations of the 
radial distortions, the effects of asymmetries and other systematic err- 
ors of the pencils of rays can be investigated. First of all the disturban- 
ces of the pencils of rays have to be determined. See for instance [5] or 
[6]. We assume the disturbances to be recorded as a vector-diagram, 
demonstrating the size and direction of the displacement of the projec- 
ted points. From such a vector-diagram the resulting y-parallaxes of 
the model can be determined in arbitrary model points. The influence 
upon the relative orientation of such y-parallaxes in the orientation 
points can then easily be found from for instance [3]. 
Then, exactly the same procedure can be used as has been demonstra- 
ted above, for single models as well as for aerial triangulation strips. 
8. The influence upon the x- and y-coordinates of the model 
As soon as the influence of radial distortion and other systematic 
errors upon the elements of the relative orientation has been determined, 
the influence upon the x-and y-coordinates of the model can be found. 
For this purpose the corresponding differential formulas have to be 
used. See for instance the expressions (4.1) and (4.3) in [4]. After 
having taken into account also the direct influence of the systematic 
disturbances upon the x- and y-coordinates of the model, the compen- 
sating effect of the absolute orientation can be determined as demonst- 
rated above for the elevations. The final errors of the x- and y-coordi- 
nates are then found in a similar way. 
Summary 
In this paper the influence of the radial distortion and other syste- 
matic errors upon the elevations and x-y-coordinates of the model via 
the relative orientation has been demonstrated. The first prerequisite 
for the practical application of the derived procedures is of course that 
the distortion curve and other systematic errors are reliably determined 
Up to now such systematic errors are not determined satisfactorily 
The errors of the pictures have to be determined under real photogra- 
phy conditions. The systematic errors of the plotting instrument must 
also be especially investigated. See [6]. For an investigation of the 
total effect of the systematic errors upon the final elevations and X-y-